[UCI-Calit2] Rminder: AFM Workshop -- June 29

[Anna Lynn Spitzer]

AFM Workshop: Revolutionary Developments in Atomic Force Microscopy


Time: 11 a.m. - noon: Introductory remarks and video presentation


      9 a.m. - 5 p.m. - Multimode-8 demonstration and imaging customer
samples



 

Date: Tuesday June 29, 2010


Location: Calit2 Microscopy Center


The atomic force microscope (AFM) has been used for many years for ultra
high-resolution microscopy and has earned a reputation as a powerful but
complex tool. Recent advances by Veeco are making the AFM easier to use,
providing more unambiguous and quantitative information, and extending
the ability of AFM to work with the most challenging samples. These
advances include ScanAsyst(tm) mode with automatic image optimization
technology that enables easier, faster, and more consistent results in
materials, life sciences and polymer research, regardless of user skill
level. A related imaging mode, PeakForce QNM, now provides quantitative
adhesion and modulus measurements on a wide range of sample types. 


More information: Albert Yee, afyee at uci.edu




 

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